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| author | Lad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com> | 2020-10-03 01:23:23 +0300 |
|---|---|---|
| committer | Mauro Carvalho Chehab <mchehab+huawei@kernel.org> | 2020-11-16 12:31:14 +0300 |
| commit | f5c24ca7bf8c707927668dc76773616a25d0fded (patch) | |
| tree | 50bc3972fe78936f285cf1a2e2ea24b7f3baddc9 /drivers/media/v4l2-core/v4l2-subdev.c | |
| parent | efcb7dda9b53d4569d08906eedc95aa51d2d5555 (diff) | |
| download | linux-f5c24ca7bf8c707927668dc76773616a25d0fded.tar.xz | |
media: i2c: ov772x: Add test pattern control
Add support for test pattern control supported by the sensor.
Signed-off-by: Lad Prabhakar <prabhakar.mahadev-lad.rj@bp.renesas.com>
Reviewed-by: Biju Das <biju.das.jz@bp.renesas.com>
Reviewed-by: Jacopo Mondi <jacopo@jmondi.org>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab+huawei@kernel.org>
Diffstat (limited to 'drivers/media/v4l2-core/v4l2-subdev.c')
0 files changed, 0 insertions, 0 deletions