diff options
Diffstat (limited to 'UnitTestFrameworkPkg/Test/GoogleTest/Sample')
6 files changed, 803 insertions, 803 deletions
diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTest.cpp b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTest.cpp index 2c2765e1e5..ac83e41d7b 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTest.cpp +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTest.cpp @@ -1,305 +1,305 @@ -/** @file
- This is a sample to demonstrates the use of GoogleTest that supports host
- execution environments.
-
- Copyright (c) 2022, Intel Corporation. All rights reserved.<BR>
- SPDX-License-Identifier: BSD-2-Clause-Patent
-
-**/
-
-#include <Library/GoogleTestLib.h>
-extern "C" {
- #include <Uefi.h>
- #include <Library/BaseLib.h>
- #include <Library/DebugLib.h>
-}
-
-/**
- Sample unit test that verifies the expected result of an unsigned integer
- addition operation.
-**/
-TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) {
- UINTN A;
- UINTN B;
- UINTN C;
-
- A = 1;
- B = 1;
- C = A + B;
-
- ASSERT_EQ (C, (UINTN)2);
-}
-
-/**
- Sample unit test that verifies that a global BOOLEAN is updatable.
-**/
-class GlobalBooleanVarTests : public ::testing::Test {
-public:
- BOOLEAN SampleGlobalTestBoolean = FALSE;
-};
-
-TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) {
- SampleGlobalTestBoolean = TRUE;
- ASSERT_TRUE (SampleGlobalTestBoolean);
-
- SampleGlobalTestBoolean = FALSE;
- ASSERT_FALSE (SampleGlobalTestBoolean);
-}
-
-/**
- Sample unit test that logs a warning message and verifies that a global
- pointer is updatable.
-**/
-class GlobalVarTests : public ::testing::Test {
-public:
- VOID *SampleGlobalTestPointer = NULL;
-
-protected:
- void
- SetUp (
- ) override
- {
- ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)NULL);
- }
-
- void
- TearDown (
- )
- {
- SampleGlobalTestPointer = NULL;
- }
-};
-
-TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) {
- SampleGlobalTestPointer = (VOID *)-1;
- ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1));
-}
-
-/**
- Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test
-**/
-class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> {
- void
- SetUp (
- )
- {
- PatchPcdSet8 (PcdDebugPropertyMask, GetParam ());
- }
-};
-
-/**
- Sample unit test using the ASSERT_TRUE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) {
- UINT64 Result;
-
- //
- // This test passes because expression always evaluated to TRUE.
- //
- ASSERT_TRUE (TRUE);
-
- //
- // This test passes because expression always evaluates to TRUE.
- //
- Result = LShiftU64 (BIT0, 1);
- ASSERT_TRUE (Result == BIT1);
-}
-
-/**
- Sample unit test using the ASSERT_FALSE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) {
- UINT64 Result;
-
- //
- // This test passes because expression always evaluated to FALSE.
- //
- ASSERT_FALSE (FALSE);
-
- //
- // This test passes because expression always evaluates to FALSE.
- //
- Result = LShiftU64 (BIT0, 1);
- ASSERT_FALSE (Result == BIT0);
-}
-
-/**
- Sample unit test using the ASSERT_EQ() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) {
- UINT64 Result;
-
- //
- // This test passes because both values are always equal.
- //
- ASSERT_EQ (1, 1);
-
- //
- // This test passes because both values are always equal.
- //
- Result = LShiftU64 (BIT0, 1);
- ASSERT_EQ (Result, (UINT64)BIT1);
-}
-
-/**
- Sample unit test using the ASSERT_STREQ() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) {
- CHAR8 *String1;
- CHAR8 *String2;
-
- //
- // This test passes because String1 and String2 are the same.
- //
- String1 = (CHAR8 *)"Hello";
- String2 = (CHAR8 *)"Hello";
- ASSERT_STREQ (String1, String2);
-}
-
-/**
- Sample unit test using the ASSERT_NE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) {
- UINT64 Result;
-
- //
- // This test passes because both values are never equal.
- //
- ASSERT_NE (0, 1);
-
- //
- // This test passes because both values are never equal.
- //
- Result = LShiftU64 (BIT0, 1);
- ASSERT_NE (Result, (UINT64)BIT0);
-}
-
-/**
- Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE)
- and EFI_EFFOR() macros to check status
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) {
- //
- // This test passes because the status is not an EFI error.
- //
- ASSERT_FALSE (EFI_ERROR (EFI_SUCCESS));
-
- //
- // This test passes because the status is not an EFI error.
- //
- ASSERT_FALSE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL));
-}
-
-/**
- Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) {
- //
- // This test passes because the status value are always equal.
- //
- ASSERT_EQ (EFI_SUCCESS, EFI_SUCCESS);
-}
-
-/**
- Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) {
- UINT64 Result;
-
- //
- // This test passes because the pointer is never NULL.
- //
- ASSERT_NE (&Result, (UINT64 *)NULL);
-}
-
-/**
- Sample unit test using that should not generate any ASSERTs()
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectNoAssertFailure) {
- //
- // This test passes because it never triggers an ASSERT().
- //
- ASSERT (TRUE);
-
- //
- // This test passes because DecimalToBcd() does not ASSERT() if the
- // value passed in is <= 99.
- //
- DecimalToBcd8 (99);
-}
-
-/**
- Sample unit test using the EXPECT_ANY_THROW() macro to test expected ASSERT()s.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectAssertFailure) {
- //
- // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
- //
- if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
- return;
- }
-
- //
- // This test passes because it directly triggers an ASSERT().
- //
- EXPECT_ANY_THROW (ASSERT (FALSE));
-
- //
- // This test passes because DecimalToBcd() generates an ASSERT() if the
- // value passed in is >= 100. The expected ASSERT() is caught by the unit
- // test framework and EXPECT_ANY_THROW() returns without an error.
- //
- EXPECT_ANY_THROW (DecimalToBcd8 (101));
-
- //
- // This test passes because DecimalToBcd() generates an ASSERT() if the
- // value passed in is >= 100. The expected ASSERT() is caught by the unit
- // test framework and throws the C++ exception of type std::runtime_error.
- // EXPECT_THROW() returns without an error.
- //
- EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error);
-
- //
- // This test passes because DecimalToBcd() generates an ASSERT() if the
- // value passed in is >= 100. The expected ASSERT() is caught by the unit
- // test framework and throws the C++ exception of type std::runtime_error with
- // a message that includes the filename, linenumber, and the expression that
- // triggered the ASSERT().
- //
- // EXPECT_THROW_MESSAGE() calls DecimalToBcd() expecting DecimalToBds() to
- // throw a C++ exception of type std::runtime_error with a message that
- // includes the expression of "Value < 100" that triggered the ASSERT().
- //
- EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 100");
-}
-
-INSTANTIATE_TEST_SUITE_P (
- ValidInput,
- MacroTestsAssertsEnabledDisabled,
- ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0))
- );
-
-/**
- Sample unit test using the SCOPED_TRACE() macro for trace messages.
-**/
-TEST (MacroTestsMessages, MacroTraceMessage) {
- //
- // Example of logging.
- //
- SCOPED_TRACE ("SCOPED_TRACE message\n");
-
- //
- // Always pass
- //
- ASSERT_TRUE (TRUE);
-}
-
-int
-main (
- int argc,
- char *argv[]
- )
-{
- testing::InitGoogleTest (&argc, argv);
- return RUN_ALL_TESTS ();
-}
+/** @file + This is a sample to demonstrates the use of GoogleTest that supports host + execution environments. + + Copyright (c) 2022, Intel Corporation. All rights reserved.<BR> + SPDX-License-Identifier: BSD-2-Clause-Patent + +**/ + +#include <Library/GoogleTestLib.h> +extern "C" { + #include <Uefi.h> + #include <Library/BaseLib.h> + #include <Library/DebugLib.h> +} + +/** + Sample unit test that verifies the expected result of an unsigned integer + addition operation. +**/ +TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) { + UINTN A; + UINTN B; + UINTN C; + + A = 1; + B = 1; + C = A + B; + + ASSERT_EQ (C, (UINTN)2); +} + +/** + Sample unit test that verifies that a global BOOLEAN is updatable. +**/ +class GlobalBooleanVarTests : public ::testing::Test { +public: + BOOLEAN SampleGlobalTestBoolean = FALSE; +}; + +TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) { + SampleGlobalTestBoolean = TRUE; + ASSERT_TRUE (SampleGlobalTestBoolean); + + SampleGlobalTestBoolean = FALSE; + ASSERT_FALSE (SampleGlobalTestBoolean); +} + +/** + Sample unit test that logs a warning message and verifies that a global + pointer is updatable. +**/ +class GlobalVarTests : public ::testing::Test { +public: + VOID *SampleGlobalTestPointer = NULL; + +protected: + void + SetUp ( + ) override + { + ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)NULL); + } + + void + TearDown ( + ) + { + SampleGlobalTestPointer = NULL; + } +}; + +TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) { + SampleGlobalTestPointer = (VOID *)-1; + ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1)); +} + +/** + Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test +**/ +class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> { + void + SetUp ( + ) + { + PatchPcdSet8 (PcdDebugPropertyMask, GetParam ()); + } +}; + +/** + Sample unit test using the ASSERT_TRUE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) { + UINT64 Result; + + // + // This test passes because expression always evaluated to TRUE. + // + ASSERT_TRUE (TRUE); + + // + // This test passes because expression always evaluates to TRUE. + // + Result = LShiftU64 (BIT0, 1); + ASSERT_TRUE (Result == BIT1); +} + +/** + Sample unit test using the ASSERT_FALSE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) { + UINT64 Result; + + // + // This test passes because expression always evaluated to FALSE. + // + ASSERT_FALSE (FALSE); + + // + // This test passes because expression always evaluates to FALSE. + // + Result = LShiftU64 (BIT0, 1); + ASSERT_FALSE (Result == BIT0); +} + +/** + Sample unit test using the ASSERT_EQ() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) { + UINT64 Result; + + // + // This test passes because both values are always equal. + // + ASSERT_EQ (1, 1); + + // + // This test passes because both values are always equal. + // + Result = LShiftU64 (BIT0, 1); + ASSERT_EQ (Result, (UINT64)BIT1); +} + +/** + Sample unit test using the ASSERT_STREQ() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) { + CHAR8 *String1; + CHAR8 *String2; + + // + // This test passes because String1 and String2 are the same. + // + String1 = (CHAR8 *)"Hello"; + String2 = (CHAR8 *)"Hello"; + ASSERT_STREQ (String1, String2); +} + +/** + Sample unit test using the ASSERT_NE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) { + UINT64 Result; + + // + // This test passes because both values are never equal. + // + ASSERT_NE (0, 1); + + // + // This test passes because both values are never equal. + // + Result = LShiftU64 (BIT0, 1); + ASSERT_NE (Result, (UINT64)BIT0); +} + +/** + Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE) + and EFI_EFFOR() macros to check status +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) { + // + // This test passes because the status is not an EFI error. + // + ASSERT_FALSE (EFI_ERROR (EFI_SUCCESS)); + + // + // This test passes because the status is not an EFI error. + // + ASSERT_FALSE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL)); +} + +/** + Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) { + // + // This test passes because the status value are always equal. + // + ASSERT_EQ (EFI_SUCCESS, EFI_SUCCESS); +} + +/** + Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) { + UINT64 Result; + + // + // This test passes because the pointer is never NULL. + // + ASSERT_NE (&Result, (UINT64 *)NULL); +} + +/** + Sample unit test using that should not generate any ASSERTs() +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectNoAssertFailure) { + // + // This test passes because it never triggers an ASSERT(). + // + ASSERT (TRUE); + + // + // This test passes because DecimalToBcd() does not ASSERT() if the + // value passed in is <= 99. + // + DecimalToBcd8 (99); +} + +/** + Sample unit test using the EXPECT_ANY_THROW() macro to test expected ASSERT()s. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectAssertFailure) { + // + // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled. + // + if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) { + return; + } + + // + // This test passes because it directly triggers an ASSERT(). + // + EXPECT_ANY_THROW (ASSERT (FALSE)); + + // + // This test passes because DecimalToBcd() generates an ASSERT() if the + // value passed in is >= 100. The expected ASSERT() is caught by the unit + // test framework and EXPECT_ANY_THROW() returns without an error. + // + EXPECT_ANY_THROW (DecimalToBcd8 (101)); + + // + // This test passes because DecimalToBcd() generates an ASSERT() if the + // value passed in is >= 100. The expected ASSERT() is caught by the unit + // test framework and throws the C++ exception of type std::runtime_error. + // EXPECT_THROW() returns without an error. + // + EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error); + + // + // This test passes because DecimalToBcd() generates an ASSERT() if the + // value passed in is >= 100. The expected ASSERT() is caught by the unit + // test framework and throws the C++ exception of type std::runtime_error with + // a message that includes the filename, linenumber, and the expression that + // triggered the ASSERT(). + // + // EXPECT_THROW_MESSAGE() calls DecimalToBcd() expecting DecimalToBds() to + // throw a C++ exception of type std::runtime_error with a message that + // includes the expression of "Value < 100" that triggered the ASSERT(). + // + EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 100"); +} + +INSTANTIATE_TEST_SUITE_P ( + ValidInput, + MacroTestsAssertsEnabledDisabled, + ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0)) + ); + +/** + Sample unit test using the SCOPED_TRACE() macro for trace messages. +**/ +TEST (MacroTestsMessages, MacroTraceMessage) { + // + // Example of logging. + // + SCOPED_TRACE ("SCOPED_TRACE message\n"); + + // + // Always pass + // + ASSERT_TRUE (TRUE); +} + +int +main ( + int argc, + char *argv[] + ) +{ + testing::InitGoogleTest (&argc, argv); + return RUN_ALL_TESTS (); +} diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTestHost.inf b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTestHost.inf index 37e7c86910..e3cf9f6875 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTestHost.inf +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTest/SampleGoogleTestHost.inf @@ -1,35 +1,35 @@ -## @file
-# This is a sample to demonstrates the use of GoogleTest that supports host
-# execution environments.
-#
-# Copyright (c) 2022, Intel Corporation. All rights reserved.<BR>
-# SPDX-License-Identifier: BSD-2-Clause-Patent
-##
-
-[Defines]
- INF_VERSION = 0x00010005
- BASE_NAME = SampleGoogleTestHost
- FILE_GUID = 7D8BBFBB-7977-4AEE-A59F-257BF5C2F87C
- MODULE_TYPE = HOST_APPLICATION
- VERSION_STRING = 1.0
-
-#
-# The following information is for reference only and not required by the build tools.
-#
-# VALID_ARCHITECTURES = IA32 X64
-#
-
-[Sources]
- SampleGoogleTest.cpp
-
-[Packages]
- MdePkg/MdePkg.dec
- UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
-
-[LibraryClasses]
- GoogleTestLib
- BaseLib
- DebugLib
-
-[Pcd]
- gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask
+## @file +# This is a sample to demonstrates the use of GoogleTest that supports host +# execution environments. +# +# Copyright (c) 2022, Intel Corporation. All rights reserved.<BR> +# SPDX-License-Identifier: BSD-2-Clause-Patent +## + +[Defines] + INF_VERSION = 0x00010005 + BASE_NAME = SampleGoogleTestHost + FILE_GUID = 7D8BBFBB-7977-4AEE-A59F-257BF5C2F87C + MODULE_TYPE = HOST_APPLICATION + VERSION_STRING = 1.0 + +# +# The following information is for reference only and not required by the build tools. +# +# VALID_ARCHITECTURES = IA32 X64 +# + +[Sources] + SampleGoogleTest.cpp + +[Packages] + MdePkg/MdePkg.dec + UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec + +[LibraryClasses] + GoogleTestLib + BaseLib + DebugLib + +[Pcd] + gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp index bb0e183305..6ecf4b92ce 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp @@ -1,334 +1,334 @@ -/** @file
- This is a sample to demonstrates the use of GoogleTest that supports host
- execution environments for test case that are always expected to fail to
- demonstrate the format of the log file and reports when failures occur.
-
- Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
- SPDX-License-Identifier: BSD-2-Clause-Patent
-
-**/
-
-#include <Library/GoogleTestLib.h>
-extern "C" {
- #include <Uefi.h>
- #include <Library/BaseLib.h>
- #include <Library/DebugLib.h>
-}
-
-/**
- Sample unit test that verifies the expected result of an unsigned integer
- addition operation.
-**/
-TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) {
- UINTN A;
- UINTN B;
- UINTN C;
-
- A = 1;
- B = 1;
- C = A + B;
-
- ASSERT_NE (C, (UINTN)2);
-}
-
-/**
- Sample unit test that verifies that a global BOOLEAN is updatable.
-**/
-class GlobalBooleanVarTests : public ::testing::Test {
-public:
- BOOLEAN SampleGlobalTestBoolean = FALSE;
-};
-
-TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) {
- SampleGlobalTestBoolean = TRUE;
- EXPECT_FALSE (SampleGlobalTestBoolean);
-
- SampleGlobalTestBoolean = FALSE;
- EXPECT_TRUE (SampleGlobalTestBoolean);
-}
-
-/**
- Sample unit test that logs a warning message and verifies that a global
- pointer is updatable.
-**/
-class GlobalVarTests : public ::testing::Test {
-public:
- VOID *SampleGlobalTestPointer = NULL;
-
-protected:
- void
- SetUp (
- ) override
- {
- ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)NULL);
- }
-
- void
- TearDown (
- )
- {
- SampleGlobalTestPointer = NULL;
- }
-};
-
-TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) {
- SampleGlobalTestPointer = (VOID *)-1;
- ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1));
-}
-
-/**
- Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test
-**/
-class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> {
- void
- SetUp (
- )
- {
- PatchPcdSet8 (PcdDebugPropertyMask, GetParam ());
- }
-};
-
-/**
- Sample unit test using the ASSERT_TRUE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) {
- UINT64 Result;
-
- //
- // This test passes because expression always evaluated to TRUE.
- //
- EXPECT_FALSE (TRUE);
-
- //
- // This test passes because expression always evaluates to TRUE.
- //
- Result = LShiftU64 (BIT0, 1);
- EXPECT_FALSE (Result == BIT1);
-}
-
-/**
- Sample unit test using the ASSERT_FALSE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) {
- UINT64 Result;
-
- //
- // This test passes because expression always evaluated to FALSE.
- //
- EXPECT_TRUE (FALSE);
-
- //
- // This test passes because expression always evaluates to FALSE.
- //
- Result = LShiftU64 (BIT0, 1);
- EXPECT_TRUE (Result == BIT0);
-}
-
-/**
- Sample unit test using the ASSERT_EQ() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) {
- UINT64 Result;
-
- //
- // This test passes because both values are always equal.
- //
- EXPECT_NE (1, 1);
-
- //
- // This test passes because both values are always equal.
- //
- Result = LShiftU64 (BIT0, 1);
- EXPECT_NE (Result, (UINT64)BIT1);
-}
-
-/**
- Sample unit test using the ASSERT_STREQ() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) {
- CHAR8 *String1;
- CHAR8 *String2;
-
- //
- // This test passes because String1 and String2 are the same.
- //
- String1 = (CHAR8 *)"Hello";
- String2 = (CHAR8 *)"Hello";
- EXPECT_STRNE (String1, String2);
-}
-
-/**
- Sample unit test using the ASSERT_NE() macro.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) {
- UINT64 Result;
-
- //
- // This test passes because both values are never equal.
- //
- EXPECT_EQ (0, 1);
-
- //
- // This test passes because both values are never equal.
- //
- Result = LShiftU64 (BIT0, 1);
- EXPECT_EQ (Result, (UINT64)BIT0);
-}
-
-/**
- Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE)
- and EFI_EFFOR() macros to check status
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) {
- //
- // This test passes because the status is not an EFI error.
- //
- EXPECT_TRUE (EFI_ERROR (EFI_SUCCESS));
-
- //
- // This test passes because the status is not an EFI error.
- //
- EXPECT_TRUE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL));
-}
-
-/**
- Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) {
- //
- // This test passes because the status value are always equal.
- //
- EXPECT_NE (EFI_SUCCESS, EFI_SUCCESS);
-}
-
-/**
- Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL.
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) {
- UINT64 Result;
-
- //
- // This test passes because the pointer is never NULL.
- //
- EXPECT_EQ (&Result, (UINT64 *)NULL);
-}
-
-/**
- Sample unit test using that generates an unexpected ASSERT
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroDirectForceAssertExpectTestFail) {
- //
- // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
- //
- if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
- EXPECT_TRUE (FALSE);
- return;
- }
-
- //
- // This test fails because it directly triggers an ASSERT().
- //
- ASSERT (FALSE);
-}
-
-/**
- Sample unit test using that generates an unexpected ASSERT
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroIndirectForceAssertExpectTestFail) {
- //
- // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
- //
- if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
- EXPECT_TRUE (FALSE);
- return;
- }
-
- //
- // This test fails because DecimalToBcd() generates an ASSERT() if the
- // value passed in is >= 100. The unexpected ASSERT() is caught by the unit
- // test framework and generates a failed test.
- //
- DecimalToBcd8 (101);
-}
-
-/**
- Sample unit test using that do not generate an expected ASSERT()
-**/
-TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectedAssertNotTriggeredExpectTestFail) {
- //
- // When ASSERT()s are disabled, all tests for ASSERT()s will fail.
- //
- if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
- EXPECT_ANY_THROW (ASSERT (TRUE));
- EXPECT_ANY_THROW (DecimalToBcd8 (99));
- EXPECT_ANY_THROW (DecimalToBcd8 (101));
- EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);
- EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error);
- EXPECT_THROW (DecimalToBcd8 (99), std::overflow_error);
- EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);
- EXPECT_THROW_MESSAGE (DecimalToBcd8 (99), "Value < 999");
- EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");
- return;
- }
-
- //
- // This test fails because ASSERT(TRUE) never triggers an ASSERT().
- //
- EXPECT_ANY_THROW (ASSERT (TRUE));
-
- //
- // This test fails because DecimalToBcd() does not generate an ASSERT() if the
- // value passed in is < 100.
- //
- EXPECT_ANY_THROW (DecimalToBcd8 (99));
-
- //
- // This test fails because DecimalToBcd() does not generate an ASSERT() if the
- // value passed in is < 100.
- //
- EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);
-
- //
- // This test fails because DecimalToBcd() does generate an ASSERT() if the
- // value passed in is >= 100, but is generates a C++ exception of type
- // std::runtime_error
- //
- EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);
-
- //
- // This test fails because DecimalToBcd() generates an ASSERT() if the
- // value passed in is >= 100. The expected ASSERT() is caught by the unit
- // test framework and throws the C++ exception of type std::runtime_error with
- // a message that includes the filename, linenumber, and the expression that
- // triggered the ASSERT(). The message generated by BcdToDecimal() is
- // "Value < 100", but the expression tested is not "Value < 100".
- //
- EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");
-}
-
-INSTANTIATE_TEST_SUITE_P (
- ValidInput,
- MacroTestsAssertsEnabledDisabled,
- ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0))
- );
-
-/**
- Sample unit test using the SCOPED_TRACE() macro for trace messages.
-**/
-TEST (MacroTestsMessages, MacroTraceMessage) {
- //
- // Example of logging.
- //
- SCOPED_TRACE ("SCOPED_TRACE message\n");
- EXPECT_TRUE (FALSE);
-}
-
-int
-main (
- int argc,
- char *argv[]
- )
-{
- testing::InitGoogleTest (&argc, argv);
- return RUN_ALL_TESTS ();
-}
+/** @file + This is a sample to demonstrates the use of GoogleTest that supports host + execution environments for test case that are always expected to fail to + demonstrate the format of the log file and reports when failures occur. + + Copyright (c) 2024, Intel Corporation. All rights reserved.<BR> + SPDX-License-Identifier: BSD-2-Clause-Patent + +**/ + +#include <Library/GoogleTestLib.h> +extern "C" { + #include <Uefi.h> + #include <Library/BaseLib.h> + #include <Library/DebugLib.h> +} + +/** + Sample unit test that verifies the expected result of an unsigned integer + addition operation. +**/ +TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) { + UINTN A; + UINTN B; + UINTN C; + + A = 1; + B = 1; + C = A + B; + + ASSERT_NE (C, (UINTN)2); +} + +/** + Sample unit test that verifies that a global BOOLEAN is updatable. +**/ +class GlobalBooleanVarTests : public ::testing::Test { +public: + BOOLEAN SampleGlobalTestBoolean = FALSE; +}; + +TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) { + SampleGlobalTestBoolean = TRUE; + EXPECT_FALSE (SampleGlobalTestBoolean); + + SampleGlobalTestBoolean = FALSE; + EXPECT_TRUE (SampleGlobalTestBoolean); +} + +/** + Sample unit test that logs a warning message and verifies that a global + pointer is updatable. +**/ +class GlobalVarTests : public ::testing::Test { +public: + VOID *SampleGlobalTestPointer = NULL; + +protected: + void + SetUp ( + ) override + { + ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)NULL); + } + + void + TearDown ( + ) + { + SampleGlobalTestPointer = NULL; + } +}; + +TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) { + SampleGlobalTestPointer = (VOID *)-1; + ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1)); +} + +/** + Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test +**/ +class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> { + void + SetUp ( + ) + { + PatchPcdSet8 (PcdDebugPropertyMask, GetParam ()); + } +}; + +/** + Sample unit test using the ASSERT_TRUE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) { + UINT64 Result; + + // + // This test passes because expression always evaluated to TRUE. + // + EXPECT_FALSE (TRUE); + + // + // This test passes because expression always evaluates to TRUE. + // + Result = LShiftU64 (BIT0, 1); + EXPECT_FALSE (Result == BIT1); +} + +/** + Sample unit test using the ASSERT_FALSE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) { + UINT64 Result; + + // + // This test passes because expression always evaluated to FALSE. + // + EXPECT_TRUE (FALSE); + + // + // This test passes because expression always evaluates to FALSE. + // + Result = LShiftU64 (BIT0, 1); + EXPECT_TRUE (Result == BIT0); +} + +/** + Sample unit test using the ASSERT_EQ() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) { + UINT64 Result; + + // + // This test passes because both values are always equal. + // + EXPECT_NE (1, 1); + + // + // This test passes because both values are always equal. + // + Result = LShiftU64 (BIT0, 1); + EXPECT_NE (Result, (UINT64)BIT1); +} + +/** + Sample unit test using the ASSERT_STREQ() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) { + CHAR8 *String1; + CHAR8 *String2; + + // + // This test passes because String1 and String2 are the same. + // + String1 = (CHAR8 *)"Hello"; + String2 = (CHAR8 *)"Hello"; + EXPECT_STRNE (String1, String2); +} + +/** + Sample unit test using the ASSERT_NE() macro. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) { + UINT64 Result; + + // + // This test passes because both values are never equal. + // + EXPECT_EQ (0, 1); + + // + // This test passes because both values are never equal. + // + Result = LShiftU64 (BIT0, 1); + EXPECT_EQ (Result, (UINT64)BIT0); +} + +/** + Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE) + and EFI_EFFOR() macros to check status +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) { + // + // This test passes because the status is not an EFI error. + // + EXPECT_TRUE (EFI_ERROR (EFI_SUCCESS)); + + // + // This test passes because the status is not an EFI error. + // + EXPECT_TRUE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL)); +} + +/** + Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) { + // + // This test passes because the status value are always equal. + // + EXPECT_NE (EFI_SUCCESS, EFI_SUCCESS); +} + +/** + Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL. +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) { + UINT64 Result; + + // + // This test passes because the pointer is never NULL. + // + EXPECT_EQ (&Result, (UINT64 *)NULL); +} + +/** + Sample unit test using that generates an unexpected ASSERT +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroDirectForceAssertExpectTestFail) { + // + // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled. + // + if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) { + EXPECT_TRUE (FALSE); + return; + } + + // + // This test fails because it directly triggers an ASSERT(). + // + ASSERT (FALSE); +} + +/** + Sample unit test using that generates an unexpected ASSERT +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroIndirectForceAssertExpectTestFail) { + // + // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled. + // + if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) { + EXPECT_TRUE (FALSE); + return; + } + + // + // This test fails because DecimalToBcd() generates an ASSERT() if the + // value passed in is >= 100. The unexpected ASSERT() is caught by the unit + // test framework and generates a failed test. + // + DecimalToBcd8 (101); +} + +/** + Sample unit test using that do not generate an expected ASSERT() +**/ +TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectedAssertNotTriggeredExpectTestFail) { + // + // When ASSERT()s are disabled, all tests for ASSERT()s will fail. + // + if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) { + EXPECT_ANY_THROW (ASSERT (TRUE)); + EXPECT_ANY_THROW (DecimalToBcd8 (99)); + EXPECT_ANY_THROW (DecimalToBcd8 (101)); + EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error); + EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error); + EXPECT_THROW (DecimalToBcd8 (99), std::overflow_error); + EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error); + EXPECT_THROW_MESSAGE (DecimalToBcd8 (99), "Value < 999"); + EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999"); + return; + } + + // + // This test fails because ASSERT(TRUE) never triggers an ASSERT(). + // + EXPECT_ANY_THROW (ASSERT (TRUE)); + + // + // This test fails because DecimalToBcd() does not generate an ASSERT() if the + // value passed in is < 100. + // + EXPECT_ANY_THROW (DecimalToBcd8 (99)); + + // + // This test fails because DecimalToBcd() does not generate an ASSERT() if the + // value passed in is < 100. + // + EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error); + + // + // This test fails because DecimalToBcd() does generate an ASSERT() if the + // value passed in is >= 100, but is generates a C++ exception of type + // std::runtime_error + // + EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error); + + // + // This test fails because DecimalToBcd() generates an ASSERT() if the + // value passed in is >= 100. The expected ASSERT() is caught by the unit + // test framework and throws the C++ exception of type std::runtime_error with + // a message that includes the filename, linenumber, and the expression that + // triggered the ASSERT(). The message generated by BcdToDecimal() is + // "Value < 100", but the expression tested is not "Value < 100". + // + EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999"); +} + +INSTANTIATE_TEST_SUITE_P ( + ValidInput, + MacroTestsAssertsEnabledDisabled, + ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0)) + ); + +/** + Sample unit test using the SCOPED_TRACE() macro for trace messages. +**/ +TEST (MacroTestsMessages, MacroTraceMessage) { + // + // Example of logging. + // + SCOPED_TRACE ("SCOPED_TRACE message\n"); + EXPECT_TRUE (FALSE); +} + +int +main ( + int argc, + char *argv[] + ) +{ + testing::InitGoogleTest (&argc, argv); + return RUN_ALL_TESTS (); +} diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf index af3d254025..ffdea8ba89 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf @@ -1,36 +1,36 @@ -## @file
-# This is a sample to demonstrates the use of GoogleTest that supports host
-# execution environments for test case that are always expected to fail to
-# demonstrate the format of the log file and reports when failures occur.
-#
-# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
-# SPDX-License-Identifier: BSD-2-Clause-Patent
-##
-
-[Defines]
- INF_VERSION = 0x00010005
- BASE_NAME = SampleGoogleTestHostExpectFail
- FILE_GUID = 6042ADD2-E024-4FD5-8CD7-B2A146BF88D7
- MODULE_TYPE = HOST_APPLICATION
- VERSION_STRING = 1.0
-
-#
-# The following information is for reference only and not required by the build tools.
-#
-# VALID_ARCHITECTURES = IA32 X64
-#
-
-[Sources]
- SampleGoogleTestExpectFail.cpp
-
-[Packages]
- MdePkg/MdePkg.dec
- UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
-
-[LibraryClasses]
- GoogleTestLib
- BaseLib
- DebugLib
-
-[Pcd]
- gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask
+## @file +# This is a sample to demonstrates the use of GoogleTest that supports host +# execution environments for test case that are always expected to fail to +# demonstrate the format of the log file and reports when failures occur. +# +# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR> +# SPDX-License-Identifier: BSD-2-Clause-Patent +## + +[Defines] + INF_VERSION = 0x00010005 + BASE_NAME = SampleGoogleTestHostExpectFail + FILE_GUID = 6042ADD2-E024-4FD5-8CD7-B2A146BF88D7 + MODULE_TYPE = HOST_APPLICATION + VERSION_STRING = 1.0 + +# +# The following information is for reference only and not required by the build tools. +# +# VALID_ARCHITECTURES = IA32 X64 +# + +[Sources] + SampleGoogleTestExpectFail.cpp + +[Packages] + MdePkg/MdePkg.dec + UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec + +[LibraryClasses] + GoogleTestLib + BaseLib + DebugLib + +[Pcd] + gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestGenerateException.cpp b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestGenerateException.cpp index 6e62bd79ff..203bfb2d34 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestGenerateException.cpp +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestGenerateException.cpp @@ -1,54 +1,54 @@ -/** @file
- This is a sample to demonstrates the use of GoogleTest that supports host
- execution environments for test case that generates an exception. For some
- host-based environments, this is a fatal condition that terminates the unit
- tests and no additional test cases are executed. On other environments, this
- condition may be report a unit test failure and continue with additional unit
- tests.
-
- Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
- SPDX-License-Identifier: BSD-2-Clause-Patent
-**/
-
-#include <Library/GoogleTestLib.h>
-extern "C" {
- #include <Uefi.h>
- #include <Library/BaseLib.h>
- #include <Library/DebugLib.h>
-}
-
-UINTN
-DivideWithNoParameterChecking (
- UINTN Dividend,
- UINTN Divisor
- )
-{
- //
- // Perform integer division with no check for divide by zero
- //
- return (Dividend / Divisor);
-}
-
-/**
- Sample unit test that generates an unexpected exception
-**/
-TEST (ExceptionTest, GenerateExceptionExpectTestFail) {
- //
- // Assertion that passes without generating an exception
- //
- EXPECT_EQ (DivideWithNoParameterChecking (20, 1), (UINTN)20);
- //
- // Assertion that generates divide by zero exception before result evaluated
- //
- EXPECT_EQ (DivideWithNoParameterChecking (20, 0), MAX_UINTN);
-}
-
-int
-main (
- int argc,
- char *argv[]
- )
-{
- testing::InitGoogleTest (&argc, argv);
- return RUN_ALL_TESTS ();
-}
+/** @file + This is a sample to demonstrates the use of GoogleTest that supports host + execution environments for test case that generates an exception. For some + host-based environments, this is a fatal condition that terminates the unit + tests and no additional test cases are executed. On other environments, this + condition may be report a unit test failure and continue with additional unit + tests. + + Copyright (c) 2024, Intel Corporation. All rights reserved.<BR> + SPDX-License-Identifier: BSD-2-Clause-Patent +**/ + +#include <Library/GoogleTestLib.h> +extern "C" { + #include <Uefi.h> + #include <Library/BaseLib.h> + #include <Library/DebugLib.h> +} + +UINTN +DivideWithNoParameterChecking ( + UINTN Dividend, + UINTN Divisor + ) +{ + // + // Perform integer division with no check for divide by zero + // + return (Dividend / Divisor); +} + +/** + Sample unit test that generates an unexpected exception +**/ +TEST (ExceptionTest, GenerateExceptionExpectTestFail) { + // + // Assertion that passes without generating an exception + // + EXPECT_EQ (DivideWithNoParameterChecking (20, 1), (UINTN)20); + // + // Assertion that generates divide by zero exception before result evaluated + // + EXPECT_EQ (DivideWithNoParameterChecking (20, 0), MAX_UINTN); +} + +int +main ( + int argc, + char *argv[] + ) +{ + testing::InitGoogleTest (&argc, argv); + return RUN_ALL_TESTS (); +} diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestHostGenerateException.inf b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestHostGenerateException.inf index 3ce356c8ce..7c53869b09 100644 --- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestHostGenerateException.inf +++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestGenerateException/SampleGoogleTestHostGenerateException.inf @@ -1,39 +1,39 @@ -## @file
-# This is a sample to demonstrates the use of GoogleTest that supports host
-# execution environments for test case that generates an exception. For some
-# host-based environments, this is a fatal condition that terminates the unit
-# tests and no additional test cases are executed. On other environments, this
-# condition may be report a unit test failure and continue with additional unit
-# tests.
-#
-# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
-# SPDX-License-Identifier: BSD-2-Clause-Patent
-##
-
-[Defines]
- INF_VERSION = 0x00010005
- BASE_NAME = SampleGoogleTestHostGenerateException
- FILE_GUID = 037A3C56-44C5-4899-AC4D-911943E6FBA1
- MODULE_TYPE = HOST_APPLICATION
- VERSION_STRING = 1.0
-
-#
-# The following information is for reference only and not required by the build tools.
-#
-# VALID_ARCHITECTURES = IA32 X64
-#
-
-[Sources]
- SampleGoogleTestGenerateException.cpp
-
-[Packages]
- MdePkg/MdePkg.dec
- UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
-
-[LibraryClasses]
- GoogleTestLib
- BaseLib
- DebugLib
-
-[Pcd]
- gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask
+## @file +# This is a sample to demonstrates the use of GoogleTest that supports host +# execution environments for test case that generates an exception. For some +# host-based environments, this is a fatal condition that terminates the unit +# tests and no additional test cases are executed. On other environments, this +# condition may be report a unit test failure and continue with additional unit +# tests. +# +# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR> +# SPDX-License-Identifier: BSD-2-Clause-Patent +## + +[Defines] + INF_VERSION = 0x00010005 + BASE_NAME = SampleGoogleTestHostGenerateException + FILE_GUID = 037A3C56-44C5-4899-AC4D-911943E6FBA1 + MODULE_TYPE = HOST_APPLICATION + VERSION_STRING = 1.0 + +# +# The following information is for reference only and not required by the build tools. +# +# VALID_ARCHITECTURES = IA32 X64 +# + +[Sources] + SampleGoogleTestGenerateException.cpp + +[Packages] + MdePkg/MdePkg.dec + UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec + +[LibraryClasses] + GoogleTestLib + BaseLib + DebugLib + +[Pcd] + gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask |