Renormalized end-of-lines from master@27b044605cd5f6b33a3d231576003850b3fe305btrunk

2 files changed, 370 insertions, 370 deletions

diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp
index bb0e183305..6ecf4b92ce 100644
--- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp
+++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestExpectFail.cpp
@@ -1,334 +1,334 @@
-/** @file

-  This is a sample to demonstrates the use of GoogleTest that supports host

-  execution environments for test case that are always expected to fail to

-  demonstrate the format of the log file and reports when failures occur.

-

-  Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>

-  SPDX-License-Identifier: BSD-2-Clause-Patent

-

-**/

-

-#include <Library/GoogleTestLib.h>

-extern "C" {

-  #include <Uefi.h>

-  #include <Library/BaseLib.h>

-  #include <Library/DebugLib.h>

-}

-

-/**

-  Sample unit test that verifies the expected result of an unsigned integer

-  addition operation.

-**/

-TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) {

-  UINTN  A;

-  UINTN  B;

-  UINTN  C;

-

-  A = 1;

-  B = 1;

-  C = A + B;

-

-  ASSERT_NE (C, (UINTN)2);

-}

-

-/**

-  Sample unit test that verifies that a global BOOLEAN is updatable.

-**/

-class GlobalBooleanVarTests : public ::testing::Test {

-public:

-  BOOLEAN SampleGlobalTestBoolean = FALSE;

-};

-

-TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) {

-  SampleGlobalTestBoolean = TRUE;

-  EXPECT_FALSE (SampleGlobalTestBoolean);

-

-  SampleGlobalTestBoolean = FALSE;

-  EXPECT_TRUE (SampleGlobalTestBoolean);

-}

-

-/**

-  Sample unit test that logs a warning message and verifies that a global

-  pointer is updatable.

-**/

-class GlobalVarTests : public ::testing::Test {

-public:

-  VOID *SampleGlobalTestPointer = NULL;

-

-protected:

-  void

-  SetUp (

-    ) override

-  {

-    ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)NULL);

-  }

-

-  void

-  TearDown (

-    )

-  {

-    SampleGlobalTestPointer = NULL;

-  }

-};

-

-TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) {

-  SampleGlobalTestPointer = (VOID *)-1;

-  ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1));

-}

-

-/**

-  Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test

-**/

-class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> {

-  void

-  SetUp (

-    )

-  {

-    PatchPcdSet8 (PcdDebugPropertyMask, GetParam ());

-  }

-};

-

-/**

-  Sample unit test using the ASSERT_TRUE() macro.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) {

-  UINT64  Result;

-

-  //

-  // This test passes because expression always evaluated to TRUE.

-  //

-  EXPECT_FALSE (TRUE);

-

-  //

-  // This test passes because expression always evaluates to TRUE.

-  //

-  Result = LShiftU64 (BIT0, 1);

-  EXPECT_FALSE (Result == BIT1);

-}

-

-/**

-  Sample unit test using the ASSERT_FALSE() macro.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) {

-  UINT64  Result;

-

-  //

-  // This test passes because expression always evaluated to FALSE.

-  //

-  EXPECT_TRUE (FALSE);

-

-  //

-  // This test passes because expression always evaluates to FALSE.

-  //

-  Result = LShiftU64 (BIT0, 1);

-  EXPECT_TRUE (Result == BIT0);

-}

-

-/**

-  Sample unit test using the ASSERT_EQ() macro.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) {

-  UINT64  Result;

-

-  //

-  // This test passes because both values are always equal.

-  //

-  EXPECT_NE (1, 1);

-

-  //

-  // This test passes because both values are always equal.

-  //

-  Result = LShiftU64 (BIT0, 1);

-  EXPECT_NE (Result, (UINT64)BIT1);

-}

-

-/**

-  Sample unit test using the ASSERT_STREQ() macro.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) {

-  CHAR8  *String1;

-  CHAR8  *String2;

-

-  //

-  // This test passes because String1 and String2 are the same.

-  //

-  String1 = (CHAR8 *)"Hello";

-  String2 = (CHAR8 *)"Hello";

-  EXPECT_STRNE (String1, String2);

-}

-

-/**

-  Sample unit test using the ASSERT_NE() macro.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) {

-  UINT64  Result;

-

-  //

-  // This test passes because both values are never equal.

-  //

-  EXPECT_EQ (0, 1);

-

-  //

-  // This test passes because both values are never equal.

-  //

-  Result = LShiftU64 (BIT0, 1);

-  EXPECT_EQ (Result, (UINT64)BIT0);

-}

-

-/**

-  Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE)

-  and EFI_EFFOR() macros to check status

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) {

-  //

-  // This test passes because the status is not an EFI error.

-  //

-  EXPECT_TRUE (EFI_ERROR (EFI_SUCCESS));

-

-  //

-  // This test passes because the status is not an EFI error.

-  //

-  EXPECT_TRUE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL));

-}

-

-/**

-  Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) {

-  //

-  // This test passes because the status value are always equal.

-  //

-  EXPECT_NE (EFI_SUCCESS, EFI_SUCCESS);

-}

-

-/**

-  Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL.

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) {

-  UINT64  Result;

-

-  //

-  // This test passes because the pointer is never NULL.

-  //

-  EXPECT_EQ (&Result, (UINT64 *)NULL);

-}

-

-/**

-  Sample unit test using that generates an unexpected ASSERT

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroDirectForceAssertExpectTestFail) {

-  //

-  // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.

-  //

-  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {

-    EXPECT_TRUE (FALSE);

-    return;

-  }

-

-  //

-  // This test fails because it directly triggers an ASSERT().

-  //

-  ASSERT (FALSE);

-}

-

-/**

-  Sample unit test using that generates an unexpected ASSERT

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroIndirectForceAssertExpectTestFail) {

-  //

-  // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.

-  //

-  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {

-    EXPECT_TRUE (FALSE);

-    return;

-  }

-

-  //

-  // This test fails because DecimalToBcd() generates an ASSERT() if the

-  // value passed in is >= 100.  The unexpected ASSERT() is caught by the unit

-  // test framework and generates a failed test.

-  //

-  DecimalToBcd8 (101);

-}

-

-/**

-  Sample unit test using that do not generate an expected ASSERT()

-**/

-TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectedAssertNotTriggeredExpectTestFail) {

-  //

-  // When ASSERT()s are disabled, all tests for ASSERT()s will fail.

-  //

-  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {

-    EXPECT_ANY_THROW (ASSERT (TRUE));

-    EXPECT_ANY_THROW (DecimalToBcd8 (99));

-    EXPECT_ANY_THROW (DecimalToBcd8 (101));

-    EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);

-    EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error);

-    EXPECT_THROW (DecimalToBcd8 (99), std::overflow_error);

-    EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);

-    EXPECT_THROW_MESSAGE (DecimalToBcd8 (99), "Value < 999");

-    EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");

-    return;

-  }

-

-  //

-  // This test fails because ASSERT(TRUE) never triggers an ASSERT().

-  //

-  EXPECT_ANY_THROW (ASSERT (TRUE));

-

-  //

-  // This test fails because DecimalToBcd() does not generate an ASSERT() if the

-  // value passed in is < 100.

-  //

-  EXPECT_ANY_THROW (DecimalToBcd8 (99));

-

-  //

-  // This test fails because DecimalToBcd() does not generate an ASSERT() if the

-  // value passed in is < 100.

-  //

-  EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);

-

-  //

-  // This test fails because DecimalToBcd() does generate an ASSERT() if the

-  // value passed in is >= 100, but is generates a C++ exception of type

-  // std::runtime_error

-  //

-  EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);

-

-  //

-  // This test fails because DecimalToBcd() generates an ASSERT() if the

-  // value passed in is >= 100.  The expected ASSERT() is caught by the unit

-  // test framework and throws the C++ exception of type std::runtime_error with

-  // a message that includes the filename, linenumber, and the expression that

-  // triggered the ASSERT().  The message generated by BcdToDecimal() is

-  // "Value < 100", but the expression tested is not "Value < 100".

-  //

-  EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");

-}

-

-INSTANTIATE_TEST_SUITE_P (

-  ValidInput,

-  MacroTestsAssertsEnabledDisabled,

-  ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0))

-  );

-

-/**

-  Sample unit test using the SCOPED_TRACE() macro for trace messages.

-**/

-TEST (MacroTestsMessages, MacroTraceMessage) {

-  //

-  // Example of logging.

-  //

-  SCOPED_TRACE ("SCOPED_TRACE message\n");

-  EXPECT_TRUE (FALSE);

-}

-

-int

-main (

-  int   argc,

-  char  *argv[]

-  )

-{

-  testing::InitGoogleTest (&argc, argv);

-  return RUN_ALL_TESTS ();

-}

+/** @file
+  This is a sample to demonstrates the use of GoogleTest that supports host
+  execution environments for test case that are always expected to fail to
+  demonstrate the format of the log file and reports when failures occur.
+
+  Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
+  SPDX-License-Identifier: BSD-2-Clause-Patent
+
+**/
+
+#include <Library/GoogleTestLib.h>
+extern "C" {
+  #include <Uefi.h>
+  #include <Library/BaseLib.h>
+  #include <Library/DebugLib.h>
+}
+
+/**
+  Sample unit test that verifies the expected result of an unsigned integer
+  addition operation.
+**/
+TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) {
+  UINTN  A;
+  UINTN  B;
+  UINTN  C;
+
+  A = 1;
+  B = 1;
+  C = A + B;
+
+  ASSERT_NE (C, (UINTN)2);
+}
+
+/**
+  Sample unit test that verifies that a global BOOLEAN is updatable.
+**/
+class GlobalBooleanVarTests : public ::testing::Test {
+public:
+  BOOLEAN SampleGlobalTestBoolean = FALSE;
+};
+
+TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) {
+  SampleGlobalTestBoolean = TRUE;
+  EXPECT_FALSE (SampleGlobalTestBoolean);
+
+  SampleGlobalTestBoolean = FALSE;
+  EXPECT_TRUE (SampleGlobalTestBoolean);
+}
+
+/**
+  Sample unit test that logs a warning message and verifies that a global
+  pointer is updatable.
+**/
+class GlobalVarTests : public ::testing::Test {
+public:
+  VOID *SampleGlobalTestPointer = NULL;
+
+protected:
+  void
+  SetUp (
+    ) override
+  {
+    ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)NULL);
+  }
+
+  void
+  TearDown (
+    )
+  {
+    SampleGlobalTestPointer = NULL;
+  }
+};
+
+TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) {
+  SampleGlobalTestPointer = (VOID *)-1;
+  ASSERT_NE ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1));
+}
+
+/**
+  Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test
+**/
+class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> {
+  void
+  SetUp (
+    )
+  {
+    PatchPcdSet8 (PcdDebugPropertyMask, GetParam ());
+  }
+};
+
+/**
+  Sample unit test using the ASSERT_TRUE() macro.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) {
+  UINT64  Result;
+
+  //
+  // This test passes because expression always evaluated to TRUE.
+  //
+  EXPECT_FALSE (TRUE);
+
+  //
+  // This test passes because expression always evaluates to TRUE.
+  //
+  Result = LShiftU64 (BIT0, 1);
+  EXPECT_FALSE (Result == BIT1);
+}
+
+/**
+  Sample unit test using the ASSERT_FALSE() macro.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) {
+  UINT64  Result;
+
+  //
+  // This test passes because expression always evaluated to FALSE.
+  //
+  EXPECT_TRUE (FALSE);
+
+  //
+  // This test passes because expression always evaluates to FALSE.
+  //
+  Result = LShiftU64 (BIT0, 1);
+  EXPECT_TRUE (Result == BIT0);
+}
+
+/**
+  Sample unit test using the ASSERT_EQ() macro.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) {
+  UINT64  Result;
+
+  //
+  // This test passes because both values are always equal.
+  //
+  EXPECT_NE (1, 1);
+
+  //
+  // This test passes because both values are always equal.
+  //
+  Result = LShiftU64 (BIT0, 1);
+  EXPECT_NE (Result, (UINT64)BIT1);
+}
+
+/**
+  Sample unit test using the ASSERT_STREQ() macro.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) {
+  CHAR8  *String1;
+  CHAR8  *String2;
+
+  //
+  // This test passes because String1 and String2 are the same.
+  //
+  String1 = (CHAR8 *)"Hello";
+  String2 = (CHAR8 *)"Hello";
+  EXPECT_STRNE (String1, String2);
+}
+
+/**
+  Sample unit test using the ASSERT_NE() macro.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) {
+  UINT64  Result;
+
+  //
+  // This test passes because both values are never equal.
+  //
+  EXPECT_EQ (0, 1);
+
+  //
+  // This test passes because both values are never equal.
+  //
+  Result = LShiftU64 (BIT0, 1);
+  EXPECT_EQ (Result, (UINT64)BIT0);
+}
+
+/**
+  Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE)
+  and EFI_EFFOR() macros to check status
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) {
+  //
+  // This test passes because the status is not an EFI error.
+  //
+  EXPECT_TRUE (EFI_ERROR (EFI_SUCCESS));
+
+  //
+  // This test passes because the status is not an EFI error.
+  //
+  EXPECT_TRUE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL));
+}
+
+/**
+  Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) {
+  //
+  // This test passes because the status value are always equal.
+  //
+  EXPECT_NE (EFI_SUCCESS, EFI_SUCCESS);
+}
+
+/**
+  Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL.
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) {
+  UINT64  Result;
+
+  //
+  // This test passes because the pointer is never NULL.
+  //
+  EXPECT_EQ (&Result, (UINT64 *)NULL);
+}
+
+/**
+  Sample unit test using that generates an unexpected ASSERT
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroDirectForceAssertExpectTestFail) {
+  //
+  // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
+  //
+  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
+    EXPECT_TRUE (FALSE);
+    return;
+  }
+
+  //
+  // This test fails because it directly triggers an ASSERT().
+  //
+  ASSERT (FALSE);
+}
+
+/**
+  Sample unit test using that generates an unexpected ASSERT
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroIndirectForceAssertExpectTestFail) {
+  //
+  // Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
+  //
+  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
+    EXPECT_TRUE (FALSE);
+    return;
+  }
+
+  //
+  // This test fails because DecimalToBcd() generates an ASSERT() if the
+  // value passed in is >= 100.  The unexpected ASSERT() is caught by the unit
+  // test framework and generates a failed test.
+  //
+  DecimalToBcd8 (101);
+}
+
+/**
+  Sample unit test using that do not generate an expected ASSERT()
+**/
+TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectedAssertNotTriggeredExpectTestFail) {
+  //
+  // When ASSERT()s are disabled, all tests for ASSERT()s will fail.
+  //
+  if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
+    EXPECT_ANY_THROW (ASSERT (TRUE));
+    EXPECT_ANY_THROW (DecimalToBcd8 (99));
+    EXPECT_ANY_THROW (DecimalToBcd8 (101));
+    EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);
+    EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error);
+    EXPECT_THROW (DecimalToBcd8 (99), std::overflow_error);
+    EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);
+    EXPECT_THROW_MESSAGE (DecimalToBcd8 (99), "Value < 999");
+    EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");
+    return;
+  }
+
+  //
+  // This test fails because ASSERT(TRUE) never triggers an ASSERT().
+  //
+  EXPECT_ANY_THROW (ASSERT (TRUE));
+
+  //
+  // This test fails because DecimalToBcd() does not generate an ASSERT() if the
+  // value passed in is < 100.
+  //
+  EXPECT_ANY_THROW (DecimalToBcd8 (99));
+
+  //
+  // This test fails because DecimalToBcd() does not generate an ASSERT() if the
+  // value passed in is < 100.
+  //
+  EXPECT_THROW (DecimalToBcd8 (99), std::runtime_error);
+
+  //
+  // This test fails because DecimalToBcd() does generate an ASSERT() if the
+  // value passed in is >= 100, but is generates a C++ exception of type
+  // std::runtime_error
+  //
+  EXPECT_THROW (DecimalToBcd8 (101), std::overflow_error);
+
+  //
+  // This test fails because DecimalToBcd() generates an ASSERT() if the
+  // value passed in is >= 100.  The expected ASSERT() is caught by the unit
+  // test framework and throws the C++ exception of type std::runtime_error with
+  // a message that includes the filename, linenumber, and the expression that
+  // triggered the ASSERT().  The message generated by BcdToDecimal() is
+  // "Value < 100", but the expression tested is not "Value < 100".
+  //
+  EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 999");
+}
+
+INSTANTIATE_TEST_SUITE_P (
+  ValidInput,
+  MacroTestsAssertsEnabledDisabled,
+  ::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0))
+  );
+
+/**
+  Sample unit test using the SCOPED_TRACE() macro for trace messages.
+**/
+TEST (MacroTestsMessages, MacroTraceMessage) {
+  //
+  // Example of logging.
+  //
+  SCOPED_TRACE ("SCOPED_TRACE message\n");
+  EXPECT_TRUE (FALSE);
+}
+
+int
+main (
+  int   argc,
+  char  *argv[]
+  )
+{
+  testing::InitGoogleTest (&argc, argv);
+  return RUN_ALL_TESTS ();
+}
diff --git a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf
index af3d254025..ffdea8ba89 100644
--- a/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf
+++ b/UnitTestFrameworkPkg/Test/GoogleTest/Sample/SampleGoogleTestExpectFail/SampleGoogleTestHostExpectFail.inf
@@ -1,36 +1,36 @@
-## @file

-# This is a sample to demonstrates the use of GoogleTest that supports host

-# execution environments for test case that are always expected to fail to

-# demonstrate the format of the log file and reports when failures occur.

-#

-# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>

-# SPDX-License-Identifier: BSD-2-Clause-Patent

-##

-

-[Defines]

-  INF_VERSION    = 0x00010005

-  BASE_NAME      = SampleGoogleTestHostExpectFail

-  FILE_GUID      = 6042ADD2-E024-4FD5-8CD7-B2A146BF88D7

-  MODULE_TYPE    = HOST_APPLICATION

-  VERSION_STRING = 1.0

-

-#

-# The following information is for reference only and not required by the build tools.

-#

-#  VALID_ARCHITECTURES           = IA32 X64

-#

-

-[Sources]

-  SampleGoogleTestExpectFail.cpp

-

-[Packages]

-  MdePkg/MdePkg.dec

-  UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec

-

-[LibraryClasses]

-  GoogleTestLib

-  BaseLib

-  DebugLib

-

-[Pcd]

-  gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask

+## @file
+# This is a sample to demonstrates the use of GoogleTest that supports host
+# execution environments for test case that are always expected to fail to
+# demonstrate the format of the log file and reports when failures occur.
+#
+# Copyright (c) 2024, Intel Corporation. All rights reserved.<BR>
+# SPDX-License-Identifier: BSD-2-Clause-Patent
+##
+
+[Defines]
+  INF_VERSION    = 0x00010005
+  BASE_NAME      = SampleGoogleTestHostExpectFail
+  FILE_GUID      = 6042ADD2-E024-4FD5-8CD7-B2A146BF88D7
+  MODULE_TYPE    = HOST_APPLICATION
+  VERSION_STRING = 1.0
+
+#
+# The following information is for reference only and not required by the build tools.
+#
+#  VALID_ARCHITECTURES           = IA32 X64
+#
+
+[Sources]
+  SampleGoogleTestExpectFail.cpp
+
+[Packages]
+  MdePkg/MdePkg.dec
+  UnitTestFrameworkPkg/UnitTestFrameworkPkg.dec
+
+[LibraryClasses]
+  GoogleTestLib
+  BaseLib
+  DebugLib
+
+[Pcd]
+  gEfiMdePkgTokenSpaceGuid.PcdDebugPropertyMask