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path: root/drivers/dma/dmatest.c
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2008-11-11dmaengine: struct device - replace bus_id with dev_name(), dev_set_name()Kay Sievers1-11/+11
Acked-by: Greg Kroah-Hartman <gregkh@suse.de> Acked-by: Maciej Sosnowski <maciej.sosnowski@intel.com> Signed-off-by: Kay Sievers <kay.sievers@vrfy.org> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-09-19drivers/dma/dmatest.c: switch a GFP_ATOMIC to GFP_KERNELAndrew Morton1-1/+1
It was needlessly using the unreliable GFP_ATOMIC. Cc: Timur Tabi <timur@freescale.com> Acked-by: Haavard Skinnemoen <haavard.skinnemoen@atmel.com> Signed-off-by: Andrew Morton <akpm@linux-foundation.org> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-09-19dmatest: properly handle duplicate DMA channelsTimur Tabi1-0/+5
Update the the dmatest driver so that it handles duplicate DMA channels properly. When a DMA client is notified of an available DMA channel, it must check if it has already allocated resources for that channel. If so, it should return DMA_DUP. This can happen, for example, if a DMA driver calls dma_async_device_register() more than once. Acked-by: Haavard Skinnemoen <haavard.skinnemoen@atmel.com> Signed-off-by: Timur Tabi <timur@freescale.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>
2008-07-08dmatest: Simple DMA memcpy test clientHaavard Skinnemoen1-0/+444
This client tests DMA memcpy using various lengths and various offsets into the source and destination buffers. It will initialize both buffers with a repeatable pattern and verify that the DMA engine copies the requested region and nothing more. It will also verify that the bytes aren't swapped around, and that the source buffer isn't modified. The dmatest module can be configured to test a specific device, a specific channel. It can also test multiple channels at the same time, and it can start multiple threads competing for the same channel. Changes since v2: * Support testing multiple channels at the same time * Support testing with multiple threads competing for the same channel * Use counting test patterns in order to catch byte ordering issues Changes since v1: * Remove extra dashes around "help" * Remove "default n" from Kconfig * Turn TEST_BUF_SIZE into a module parameter * Return DMA_NAK instead of DMA_DUP * Print unhandled events * Support testing specific channels and devices * Move to the end of the Makefile Acked-by: Maciej Sosnowski <maciej.sosnowski@intel.com> Signed-off-by: Haavard Skinnemoen <hskinnemoen@atmel.com> Signed-off-by: Dan Williams <dan.j.williams@intel.com>