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-rw-r--r--Documentation/ABI/testing/sysfs-bus-iio18
1 files changed, 18 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio
index 9a70c31619ea..923070934228 100644
--- a/Documentation/ABI/testing/sysfs-bus-iio
+++ b/Documentation/ABI/testing/sysfs-bus-iio
@@ -661,6 +661,24 @@ Description:
value is in raw device units or in processed units (as _raw
and _input do on sysfs direct channel read attributes).
+What: /sys/.../events/in_accel_scale
+What: /sys/.../events/in_accel_peak_scale
+What: /sys/.../events/in_anglvel_scale
+What: /sys/.../events/in_magn_scale
+What: /sys/.../events/in_rot_from_north_magnetic_scale
+What: /sys/.../events/in_rot_from_north_true_scale
+What: /sys/.../events/in_voltage_scale
+What: /sys/.../events/in_voltage_supply_scale
+What: /sys/.../events/in_temp_scale
+What: /sys/.../events/in_illuminance_scale
+What: /sys/.../events/in_proximity_scale
+KernelVersion: 3.21
+Contact: linux-iio@vger.kernel.org
+Description:
+ Specifies the conversion factor from the standard units
+ to device specific units used to set the event trigger
+ threshold.
+
What: /sys/.../events/in_accel_x_thresh_rising_hysteresis
What: /sys/.../events/in_accel_x_thresh_falling_hysteresis
What: /sys/.../events/in_accel_x_thresh_either_hysteresis