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-rw-r--r--Documentation/ABI/testing/sysfs-driver-w1_therm75
1 files changed, 51 insertions, 24 deletions
diff --git a/Documentation/ABI/testing/sysfs-driver-w1_therm b/Documentation/ABI/testing/sysfs-driver-w1_therm
index 8873bbb075cb..6a37dc33ffdb 100644
--- a/Documentation/ABI/testing/sysfs-driver-w1_therm
+++ b/Documentation/ABI/testing/sysfs-driver-w1_therm
@@ -22,8 +22,10 @@ Description:
device data to its embedded EEPROM, either restore data
embedded in device EEPROM. Be aware that devices support
limited EEPROM writing cycles (typical 50k)
+
* 'save': save device RAM to EEPROM
* 'restore': restore EEPROM data in device RAM
+
Users: any user space application which wants to communicate with
w1_term device
@@ -33,9 +35,11 @@ Date: May 2020
Contact: Akira Shimahara <akira215corp@gmail.com>
Description:
(RO) return the power status by asking the device
+
* '0': device parasite powered
* '1': device externally powered
* '-xx': xx is kernel error when reading power status
+
Users: any user space application which wants to communicate with
w1_term device
@@ -49,10 +53,12 @@ Description:
will be changed only in device RAM, so it will be cleared when
power is lost. Trigger a 'save' to EEPROM command to keep
values after power-on. Read or write are :
+
* '9..14': device resolution in bit
- or resolution to set in bit
+ or resolution to set in bit
* '-xx': xx is kernel error when reading the resolution
* Anything else: do nothing
+
Some DS18B20 clones are fixed in 12-bit resolution, so the
actual resolution is read back from the chip and verified. Error
is reported if the results differ.
@@ -65,16 +71,18 @@ Date: May 2020
Contact: Akira Shimahara <akira215corp@gmail.com>
Description:
(RO) return the temperature in 1/1000 degC.
+
* If a bulk read has been triggered, it will directly
- return the temperature computed when the bulk read
- occurred, if available. If not yet available, nothing
- is returned (a debug kernel message is sent), you
- should retry later on.
+ return the temperature computed when the bulk read
+ occurred, if available. If not yet available, nothing
+ is returned (a debug kernel message is sent), you
+ should retry later on.
* If no bulk read has been triggered, it will trigger
- a conversion and send the result. Note that the
- conversion duration depend on the resolution (if
- device support this feature). It takes 94ms in 9bits
- resolution, 750ms for 12bits.
+ a conversion and send the result. Note that the
+ conversion duration depend on the resolution (if
+ device support this feature). It takes 94ms in 9bits
+ resolution, 750ms for 12bits.
+
Users: any user space application which wants to communicate with
w1_term device
@@ -86,12 +94,14 @@ Description:
(RW) return the temperature in 1/1000 degC.
*read*: return 2 lines with the hexa output data sent on the
bus, return the CRC check and temperature in 1/1000 degC
- *write* :
+ *write*:
+
* '0' : save the 2 or 3 bytes to the device EEPROM
- (i.e. TH, TL and config register)
+ (i.e. TH, TL and config register)
* '9..14' : set the device resolution in RAM
- (if supported)
+ (if supported)
* Anything else: do nothing
+
refer to Documentation/w1/slaves/w1_therm.rst for detailed
information.
Users: any user space application which wants to communicate with
@@ -103,14 +113,21 @@ Date: May 2020
Contact: Akira Shimahara <akira215corp@gmail.com>
Description:
(RW) trigger a bulk read conversion. read the status
+
*read*:
- * '-1': conversion in progress on at least 1 sensor
- * '1' : conversion complete but at least one sensor
+ * '-1':
+ conversion in progress on at least 1 sensor
+ * '1' :
+ conversion complete but at least one sensor
value has not been read yet
- * '0' : no bulk operation. Reading temperature will
+ * '0' :
+ no bulk operation. Reading temperature will
trigger a conversion on each device
- *write*: 'trigger': trigger a bulk read on all supporting
+
+ *write*:
+ 'trigger': trigger a bulk read on all supporting
devices on the bus
+
Note that if a bulk read is sent but one sensor is not read
immediately, the next access to temperature on this device
will return the temperature measured at the time of issue
@@ -128,14 +145,19 @@ Description:
reset to default (datasheet) conversion time for a new
resolution.
- *read*: Actual conversion time in milliseconds. *write*:
- '0': Set the default conversion time from the datasheet.
- '1': Measure and set the conversion time. Make a single
+ *read*:
+ Actual conversion time in milliseconds.
+
+ *write*:
+ * '0':
+ Set the default conversion time from the datasheet.
+ * '1':
+ Measure and set the conversion time. Make a single
temperature conversion, measure an actual value.
Increase it by 20% for temperature range. A new
conversion time can be obtained by reading this
same attribute.
- other positive value:
+ * other positive value:
Set the conversion time in milliseconds.
Users: An application using the w1_term device
@@ -148,16 +170,21 @@ Description:
(RW) Control optional driver settings.
Bit masks to read/write (bitwise OR):
- 1: Enable check for conversion success. If byte 6 of
+ == ============================================================
+ 1 Enable check for conversion success. If byte 6 of
scratchpad memory is 0xC after conversion, and
temperature reads 85.00 (powerup value) or 127.94
(insufficient power) - return a conversion error.
- 2: Enable poll for conversion completion. Generate read cycles
+ 2 Enable poll for conversion completion. Generate read cycles
after the conversion start and wait for 1's. In parasite
power mode this feature is not available.
+ == ============================================================
+
+ *read*:
+ Currently selected features.
- *read*: Currently selected features.
- *write*: Select features.
+ *write*:
+ Select features.
Users: An application using the w1_term device