diff options
-rw-r--r-- | drivers/mtd/tests/mtd_nandecctest.c | 18 |
1 files changed, 16 insertions, 2 deletions
diff --git a/drivers/mtd/tests/mtd_nandecctest.c b/drivers/mtd/tests/mtd_nandecctest.c index d3e8873ad38a..d90daf879c46 100644 --- a/drivers/mtd/tests/mtd_nandecctest.c +++ b/drivers/mtd/tests/mtd_nandecctest.c @@ -9,11 +9,25 @@ #if defined(CONFIG_MTD_NAND) || defined(CONFIG_MTD_NAND_MODULE) +/* + * The reason for this __change_bit_le() instead of __change_bit() is to inject + * bit error properly within the region which is not a multiple of + * sizeof(unsigned long) on big-endian systems + */ +#ifdef __LITTLE_ENDIAN +#define __change_bit_le(nr, addr) __change_bit(nr, addr) +#elif defined(__BIG_ENDIAN) +#define __change_bit_le(nr, addr) \ + __change_bit((nr) ^ ((BITS_PER_LONG - 1) & ~0x7), addr) +#else +#error "Unknown byte order" +#endif + static void inject_single_bit_error(void *data, size_t size) { - unsigned long offset = random32() % (size * BITS_PER_BYTE); + unsigned int offset = random32() % (size * BITS_PER_BYTE); - __change_bit(offset, data); + __change_bit_le(offset, data); } static void dump_data_ecc(void *error_data, void *error_ecc, void *correct_data, |