BMC/Intel-BMC/linux.git/drivers/of/unittest.c, branch dev-4.4

of/unittest: add missing of_node_put

2015-10-22T14:26:28+00:00

for_each_child_of_node performs an of_node_get on each iteration, so a break out of the loop requires an of_node_put. A simplified version of the semantic patch that fixes this problem is as follows (http://coccinelle.lip6.fr): // @@ expression root,e; local idexpression child; @@ for_each_child_of_node(root, child) { ... when != of_node_put(child) when != e = child ( return child; | + of_node_put(child); ? return ...; ) ... } // Combine the puts into code at the end of the function, for conciseness. Signed-off-by: Julia Lawall Signed-off-by: Rob Herring

of: Drop owner assignment from platform and i2c driver

2015-07-27T13:24:39+00:00

platform_driver and i2c_driver do not need to set an owner because core will set it. Signed-off-by: Krzysztof Kozlowski Signed-off-by: Rob Herring

Merge tag 'devicetree-for-4.1' of git://git.kernel.org/pub/scm/linux/kernel/git/robh/linux

2015-04-24T15:46:18+00:00

Pull second batch of devicetree updates from Rob Herring: "As Grant mentioned in the first devicetree pull request, here is the 2nd batch of DT changes for 4.1. The main remaining item here is the endianness bindings and related 8250 driver support. - DT endianness specification bindings - big-endian 8250 serial support - DT overlay unittest updates - various DT doc updates - compile fixes for OF_IRQ=n" * tag 'devicetree-for-4.1' of git://git.kernel.org/pub/scm/linux/kernel/git/robh/linux: frv: add io{read,write}{16,32}be functions mn10300: add io{read,write}{16,32}be functions Documentation: DT bindings: add doc for Altera's SoCFPGA platform of: base: improve of_get_next_child() kernel-doc Doc: dt: arch_timer: discourage clock-frequency use of: unittest: overlay: Keep track of created overlays of/fdt: fix allocation size for device node path serial: of_serial: Support big-endian register accesses serial: 8250: Add support for big-endian MMIO accesses of: Document {little,big,native}-endian bindings of/fdt: Add endianness helper function for early init code of: Add helper function to check MMIO register endianness of/fdt: Remove "reg" data prints from early_init_dt_scan_memory of: add vendor prefix for Artesyn of: Add dummy of_irq_to_resource_table() for IRQ_OF=n of: OF_IRQ should depend on IRQ_DOMAIN

of: unittest: overlay: Keep track of created overlays

2015-04-15T00:35:46+00:00

During the course of the overlay selftests some of them remain applied. While this does not pose a real problem, make sure you track them and destroy them at the end of the test. Signed-off-by: Pantelis Antoniou Signed-off-by: Rob Herring

Merge remote-tracking branch 'robh/for-next' into devicetree/next

2015-03-29T07:59:58+00:00

Conflicts: drivers/of/unittest.c

of/unittest: Fix of_platform_depopulate test case

2015-03-29T07:56:20+00:00

The previous commit, "of/unittest: early return from test skips tests" exposed broken tests for the of_platform_unpopulate() function. The problem was the populate and depopulate calls were not symmetrical like they were intended to be, and unpopulate depends on the parent device to have it's of_node pointer pointing to the parent device node. Fix these bugs so that the test case works correctly. In the process, the test_bus used as a container for the test devices has been changed from a statically allocated struct device (which is bad) to a properly allocated device with a .release() method (which is good). This stops the test code from being a bad example of abusing the device model. Signed-off-by: Grant Likely Cc: Frank Rowand Cc: Pantelis Antoniou Cc: Pawel Moll

of/unittest: early return from test skips tests

2015-03-29T07:56:19+00:00

Fix bugs pointed out by checkpatch: Mis-coding of two if statements caused early return from function. Number of tests completed increased from 102 to 107. Number of tests failed increased from 0 to 2. Signed-off-by: Frank Rowand Signed-off-by: Grant Likely

of/unittest: breadcrumbs to reduce pain of future maintainers

2015-03-29T07:56:19+00:00

Fix warnings pointed out by checkpatch. Checkpatch warns: externs should be avoided in .c files Reducing pain for future maintainers - adding a comment so that anyone trying to find where the extern data is created will be able to find it. (grep will not find that location) Signed-off-by: Frank Rowand Signed-off-by: Grant Likely

of/unittest: reduce checkpatch noise - line after declarations

2015-03-29T07:56:18+00:00

Fix warnings pointed out by checkpatch. No bug fixes, but reduce the number of checkpatch warnings so that future problems will stand out better. Signed-off-by: Frank Rowand Signed-off-by: Grant Likely

of/unittest: typo in error string

2015-03-29T07:56:18+00:00

Fix bug pointed out by checkpatch. Splitting string incorrectly removed a space between two words. Signed-off-by: Frank Rowand Signed-off-by: Grant Likely